David R. Carey's Engineering Page : <center>Welcome to Dr. Carey's Engineering Page</center>

Education
- Clarkson University , Doctor of Philosophy, Electrical and Computer Engineering, May 2011
- Wilkes University, Master of Science, Electrical Engineering, May 1998
- Wilkes University, Bachelor of Science, Electrical Engineering, May 1983
Professional:
- 35+ years professional experience in the areas of system test design, program management, advance product development, functional test and diagnostic test
- Hiller Measurements, Principal Engineer, Oct.2019-Present
- Lockheed-Martin, Electrical Engineering Design Manager, Feb. 2017-Oct.2019
- Wilkes University, Associate Professor of EE, 1998-2017
- Tobyhanna Army Depot, Chief Automated Test Equipment Development and Support, 2009-2013
- Instrumentation Engineering LLC, VP Engineering, 2007-2009 (Now IE Test Systems LLC)
- Lockheed-Martin, Engineering Manager, 2004-2007
- Flextronics International (Formerly Instrumentation Engineering Inc), Director of Engineering, 2001-2004
- Instrumentation Engineering Inc, Director of Engineering, 1999-2001
- Giordano Automation Corp, VP Engineering, 1994-1995, 1997-1999 (Now VSE Corp)
- Primus Technologies Corp, Test Engineer/Manager, 1995-1997
- Tobyhanna Army Depot, Test Program Development Engineer, 1983-1994
Awards:
- Best Test Architecture and Programming Track Paper at Autotestcon 2011, in Baltimore, MD. for A Methodology for Enhancing Legacy TPS/ATS Sustainability via Employing Synthetic Instrumentation Technology , Authors, Carey, Lowdermilk, Antall, and Allegra.
- John Slattery Professional Acheivement Award, IEEE/NDIA-ATC at Autotestcon 2011, in Baltimore, MD.
- Keynote Speaker, Aerospace and Defense Symposium, NIWeek 2011, Austin, TX
- Wilkes University Adjunct Faculty Teacher of the Year: May 2006, May 2004, May 2003.
- National Leadership Award/ 2003 Pennsylvania Businessman of the Year from the National Business Advisory Council for promoting a pro-business agenda including tax reform and fiscal responsibility. Washington DC December 2002
- Wilkes University 1998 Outstanding Electrical Engineering Graduate Student, Wilkes University, Wilkes-Barre, PA
- Walt Peterson IEEE Memorial Award for the "Most Technologically Significant" paper on A New Breed of Smart Depot Testers using COTS Technology at Autotestcon 1995, in Atlanta, Ga.
Papers:
- A new breed of smart depot testers using COTS technology P.J. Giordano;D. Carey Conference Record AUTOTESTCON '95. Year: 1995 | Conference Paper | Publisher: IEEE
  - Participation in Industry Peer Groups
    - National Defense Industrial Association (NDIA) Member
    - IEEE Member
    - Test Program Set IPT (DoD AMB)
    - Framework IPT (DoD AMB)
    - NxTest IPT (DoD AMB)
    - NDIA Automatic Test Comittee
    - MIL-PRF-32070 evaluation team
    - Wilkes University Industrial Advisory Board
    - Founding member of the Wilkes-Barre Chapter of the Mushroom Corp.
  - E-mail: <david.carey@wilkes.edu
  Dr Carey earned his PhD in Electrical and Computer Engineering from Clarkson University. Reasearch was entitled:
  "Enhancing the Diagnostic Process for Legacy Test Program Sets using Fault Modeling and Dynamic Reasoning"
  ABSTRACT
  
  The electronics industry and the Department of Defense (DoD), has thousands of obsolete legacy automated test systems (ATS). There are many systems, with different hardware and software architectures, that cannot be upgraded. The inability to reliably test products, diagnose faults, and collect historical data is having an effect on mission readiness. This thesis produced a test and diagnostic system architecture that provides a means to use historical test and repair data from all levels of operation. The process reduces rework costs and decreases maintenance and repair costs through earlier and more accurate fault isolation. This work recoups the efforts of the original developer and captures test and diagnostic knowledge for the future. It has been adopted by the DoD maintenance community as a means to guarantee continued support in meeting mission requirements. Consequently, the concept has been proposed, reviewed, and approved for implementation within the Army ATS/TPS centers for use at the Army maintnenance depots. Additional benefits from this work: development of a reliability database for system, subsystem, component by test type and ATS; tracking system reliability and mission performance data for use in developing requirements for new or upgrade system procurement specifications; and for pushing diagnaostic knowledge and support from the sustainment level to the field and vice versa. The work presented will change the process of developing, maintaining and migrating diagnostic test now and into the future.
  
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Welcome to Dr. Carey's Engineering Page

ABSTRACT