Welcome to Dr. Carey's Engineering Page

• Teaching Philosophy
• Research Philosophy
• Curricilum Vitae

• Education
  •  Clarkson University , Doctor of Philosophy, Electrical and Computer Engineering, May 2011
  •  Wilkes University, Master of Science, Electrical Engineering, May 1998
  •  Wilkes University, Bachelor of Science, Electrical Engineering, May 1983
•  Professional: 
  •  35+ years professional experience in the areas of system test design, program management, advance product development, functional test and diagnostic test 
  • Hiller Measurements, Principal Engineer, Oct.2019-Present
  • Lockheed-Martin, Electrical Engineering Design Manager, Feb. 2017-Oct.2019
  • Wilkes University, Associate Professor of EE, 1998-2017
  • Tobyhanna Army Depot, Chief Automated Test Equipment Development and Support, 2009-2013
  • Instrumentation Engineering LLC, VP Engineering, 2007-2009 (Now IE Test Systems LLC)
  • Lockheed-Martin, Engineering Manager, 2004-2007
  • Flextronics International (Formerly Instrumentation Engineering Inc), Director of  Engineering, 2001-2004
  • Instrumentation Engineering Inc, Director of  Engineering, 1999-2001
  • Giordano Automation Corp, VP Engineering, 1994-1995, 1997-1999 (Now VSE Corp)
  • Primus Technologies Corp, Test Engineer/Manager, 1995-1997
  • Tobyhanna Army Depot, Test Program Development Engineer, 1983-1994
• Awards: 
  • Best Test Architecture and Programming Track Paper at Autotestcon 2011, in Baltimore, MD. for A Methodology for Enhancing Legacy TPS/ATS Sustainability via Employing Synthetic Instrumentation Technology , Authors, Carey, Lowdermilk, Antall, and Allegra.
  • John Slattery Professional Acheivement Award, IEEE/NDIA-ATC at Autotestcon 2011, in Baltimore, MD.
  • Keynote Speaker, Aerospace and Defense Symposium, NIWeek 2011, Austin, TX
  • Wilkes University Adjunct Faculty Teacher of the Year: May 2006, May 2004, May 2003.
  • National Leadership Award/ 2003 Pennsylvania Businessman of the Year from the National Business Advisory Council for promoting a pro-business agenda including tax reform and fiscal responsibility. Washington DC December 2002
  • Wilkes University 1998 Outstanding Electrical Engineering Graduate Student, Wilkes University, Wilkes-Barre, PA
  • Walt Peterson IEEE Memorial Award for the "Most Technologically Significant" paper on A New Breed of Smart Depot Testers using COTS Technology at Autotestcon 1995, in Atlanta, Ga.
•  Papers:
  • Testability-Who Cares The Military Perspective  , Presented at IEEE Autotestcon 2012, September 2012, Anaheim, CA
    Legacy Test Program Sets Migration using Fault Modeling and Dynamic Reasoning , IEEE Proceedings Autotestcon 2012, September 2012, Anaheim, CA
  • A Methodology for Enhancing Legacy TPS/ATS Sustainability via Employing Synthetic Instrumentation Technology , IEEE Proceedings Autotestcon 2011, September 2011, Baltimore, MD.
  • Army Repair Depot Automated Test System Modernization , Instrumentation & Measurement Magazine, IEEE Volume: 14 , Issue: 4 Digital Object Identifier: 10.1109/MIM.2011.5961367 Publication Year: 2011 , Page(s): 28-32
  • Tobyhanna Army Depot Automated Test System Modernization , Aerospace and Electronic Systems Magazine, IEEE Volume: 26 , Issue: 9 Digital Object Identifier: 10.1109/MAES.2011.6069901 Publication Year: 2011 , Page(s): 22-26
  • Modernizing Legacy Automated Test Systems for DoD Depots, IEEE Proceedings Autotestcon 2010, September 2010, Orlando, FL
  •  Tobyhanna Army Depot Automated Test System Modernization, IEEE Proceedings Autotestcon 2010, September 2010, Orlando, FL.
  •  Improving Functiona/Diagnostic Testing using Model-Based Reasoning, IEEE, Proceedings Autotestcon 1998, September 1998, Salt Lake City, UT.
  •  Prognostic Framework, IEEE, Proceedings Autotestcon 1998, September 1998, Salt Lake City, UT.
  •  Developing Diagnostic Test Programs using model-based Reasoning, Wilkes University, May 1998, Wilkes-Barre, PA
  •  A New Breed of Smart Depot Testers using COTS Technology, IEEE, Proceedings Autotestcon 1995, August 1995, Atlanta, Ga.
  • Participation in Industry Peer Groups
    • National Defense Industrial Association (NDIA)  Member
    • IEEE Member
    •  Test Program Set IPT (DoD AMB)
    • Framework IPT (DoD AMB)
    • NxTest IPT (DoD AMB)
    • NDIA Automatic Test Comittee
    • MIL-PRF-32070 evaluation team
    • Wilkes University Industrial Advisory Board
    • Founding member of the Wilkes-Barre Chapter of the Mushroom Corp.

  

   

  • E-mail:   <david.carey@wilkes.edu
  Dr Carey earned his PhD in Electrical and Computer Engineering from Clarkson University. Reasearch was entitled:
    "Enhancing the Diagnostic Process for Legacy Test Program Sets using Fault Modeling and Dynamic Reasoning"

  ABSTRACT

  The electronics industry and the Department of Defense (DoD), has thousands of obsolete legacy automated test systems (ATS).  There are many systems, with different hardware and software architectures, that cannot be upgraded. The inability to reliably test products, diagnose faults, and collect historical data is having an effect on mission readiness. This thesis produced a test and diagnostic system architecture that provides a means to use historical test and repair data from all levels of operation. The process reduces rework costs and decreases maintenance and repair costs through earlier and more accurate fault isolation. This work recoups the efforts of the original developer and captures test and diagnostic knowledge for the future. It has been adopted by the DoD maintenance community as a means to guarantee continued support in meeting mission requirements. Consequently, the concept has been proposed, reviewed, and approved for implementation within the Army ATS/TPS centers for use at the Army maintnenance depots. Additional benefits from this work: development of a reliability database for system, subsystem, component by test type and ATS; tracking system reliability and mission performance data for use in developing requirements for new or upgrade system procurement specifications; and for pushing diagnaostic knowledge and support from the sustainment level to the field and vice versa.  The work presented will change the process of developing, maintaining and migrating diagnostic test now and into the future.

   

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This Page was last update: Monday, January 13, 2020 at 3:31:10 PM
This page was originally posted: 10/2/03; 10:04:21 AM.
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