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Welcome to Dr. Carey's Engineering Page

Author:   David Carey  
Posted: 10/2/03; 10:04:21 AM
Topic:
Welcome to Dr. Carey's Engineering Page
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David R. Carey PhD:  
Follow the link for more information on Dr Carey's:
  • Education
  •  Professional: 
  • Awards: 
  •  Papers:

    • Automated Test Systems Test Program Software | Making the Invisible Visible David R. Carey;Jerome Romania IEEE Instrumentation & Measurement Magazine Year: 2020 | Volume: 23, Issue: 5 | Magazine Article | Publisher: IEEE

    • Automated Test Systems Test Program Software | The Invisible Technology David R. Carey;Jerome Romania 2019 IEEE AUTOTESTCON Year: 2019 | Conference Paper | Publisher: IEEE

    • Introduction to Automated Test Systems | Back to Basics David R. Carey 2019 IEEE AUTOTESTCON Year: 2019 | Conference Paper | Publisher: IEEE

    • Inhibiting factors in design for testability higher education David Carey;Russell Shannon, 2016 IEEE AUTOTESTCON Year: 2016 | Conference Paper | Publisher: IEEE

    • Testing software defined and cognitive radios using software defined synthetic instruments David Carey;Robert Lowdermilk;Michael Spinali IEEE Instrumentation & Measurement Magazine Year: 2015 | Volume: 18, Issue: 2 | Magazine Article | Publisher: IEEE

    • Automating Microwave Measurements with Software Defined Synthetic Instrumentation Alexis Allegra, Michael Spinali, David Carey, Microwave Journal Year: 2015 | Volume: 58, Issue: 3 | Magazine Article | Publisher: Horizon House Publications Inc.

    • Synthetic Instrumentation Eases ATE Obsolescence Woes David Carey;Robert Lowdermilk, COTS Journal Year: 2014 | Volume: 16, Issue: 4 | Magazine Article | Publisher: RTC Group

    • Legacy test program sets migration using fault modeling and dynamic reasoning David R. Carey 2012 IEEE AUTOTESTCON Proceedings Year: 2012 | Conference Paper | Publisher: IEEE

    • Tobyhanna army depot Automated Test System modernization David R. Carey IEEE Aerospace and Electronic Systems Magazine Year: 2011 | Volume: 26, Issue: 9 | Magazine Article | Publisher: IEEE

    • A methodology for enhancing legacy TPS/ATS sustainability via employing Synthetic Instrumentation technology David Carey;Christopher Antall;Robert Wade Lowdermilk;Alexis Allegra 2011 IEEE AUTOTESTCON Year: 2011 | Conference Paper | Publisher: IEEE

    • Army repair depot automated test system modernization David R. Carey IEEE Instrumentation & Measurement Magazine Year: 2011 | Volume: 14, Issue: 4 | Magazine Article | Publisher: IEEE

    • Modernizing legacy Automated Test Systems for DoD depots David R. Carey;Michael Dewey 2010 IEEE AUTOTESTCON Year: 2010 | Conference Paper | Publisher: IEEE

    • Enhancing the diagnostic process for legacy test program sets using fault modeling and dynamic reasoning David R. Carey 2010 IEEE AUTOTESTCON Year: 2010 | Conference Paper | Publisher: IEEE

    • Tobyhanna army depot automated test system modernization David R. Carey 2010 IEEE AUTOTESTCON Year: 2010 | Conference Paper | Publisher: IEEE

    • Prognostics framework for weapon systems health monitoring L.P. Su;M. Nolan;G. DeMare;D.R. Carey 1999 IEEE AUTOTESTCON Proceedings Year: 1999 | Conference Paper | Publisher: IEEE

    • Improving functional and diagnostic testing using model-based reasoning D.R. Carey;P.L. Dussault 1998 IEEE AUTOTESTCON Proceedings. Year: 1998 | Conference Paper | Publisher: IEEE

    • A new breed of smart depot testers using COTS technology P.J. Giordano;D. Carey Conference Record AUTOTESTCON '95. Year: 1995 | Conference Paper | Publisher: IEEE

      • Participation in Industry Peer Groups
        • IEEE Member
        •  Test Program Set IPT (DoD AMB)
        • Framework IPT (DoD AMB)
        • NxTest IPT (DoD AMB)
        • NDIA Automatic Test Comittee
        • MIL-PRF-32070 evaluation team
        • Wilkes University Industrial Advisory Board
        • Founding member of the Wilkes-Barre Chapter of the Mushroom Corp.

      MRCSmall:

       

      Dr Carey earned his PhD in Electrical and Computer Engineering from Clarkson University. Reasearch was entitled:
       
      "Enhancing the Diagnostic Process for Legacy Test Program Sets using Fault Modeling and Dynamic Reasoning"

      ABSTRACT

      The electronics industry and the Department of Defense (DoD), has thousands of obsolete legacy automated test systems (ATS).  There are many systems, with different hardware and software architectures, that cannot be upgraded. The inability to reliably test products, diagnose faults, and collect historical data is having an effect on mission readiness. This thesis produced a test and diagnostic system architecture that provides a means to use historical test and repair data from all levels of operation. The process reduces rework costs and decreases maintenance and repair costs through earlier and more accurate fault isolation. This work recoups the efforts of the original developer and captures test and diagnostic knowledge for the future. It has been adopted by the DoD maintenance community as a means to guarantee continued support in meeting mission requirements. Consequently, the concept has been proposed, reviewed, and approved for implementation within the Army ATS/TPS centers for use at the Army maintnenance depots. Additional benefits from this work: development of a reliability database for system, subsystem, component by test type and ATS; tracking system reliability and mission performance data for use in developing requirements for new or upgrade system procurement specifications; and for pushing diagnaostic knowledge and support from the sustainment level to the field and vice versa.  The work presented will change the process of developing, maintaining and migrating diagnostic test now and into the future.

       

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This page was originally posted: 10/2/03; 10:04:21 AM.
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